X-ray milliprobe analysis
X-ray milliprobe analysis [Te].Specialized form of X-RAY FLUORESCENCE SPECTROMETRY involving the use of an instrument that allows a small and highly focused X-ray beam to be directed at a pre-selected point on the surface of a sample. Secondary X-rays emitted from the target point are directed to a detector and analysed as a spectrograph to reveal the presence and relative concentration of different elements. The great advantage of the technique is its ability to examine very small areas such as individual layers of paint or single minerals within a sample; there is, however, the associated danger that materials are characterized on the basis of unrepresentative samples.
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