X-ray fluorescence spectrometry
X-ray fluorescence spectrometry (XRF) [Te].Non-destructive method for determining the elemental composition of natural and man-made materials such as ceramic, glaze, glass, obsidian, pigments, paint, and coins as an aid to determining their source, technology of production, and similarity to other examples of comparable style or form. A sample is exposed to an X-ray source causing it to fluoresce and emit secondary X-rays. The wavelengths of the released energy, known as fluorescent X-rays, are detected and measured as a spectrograph. Component elements can be identified on the basis of the unique wavelength of their fluorescent X-rays, while concentrations can be estimated from the intensity of the released X-rays. Since only the surface of an object is studied, care needs to be taken that corrosion and decay do not affect the analysis.
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