scanning electron microscope
scanning electron microscope (SEM) [Eq].High-powered indirect microscope that produces an image by bombarding a sample with a beam of high-energy electrons. The electrons emitted from the sample are then scanned to form a magnified image which allows the examination of the structure, relief, and morphology of materials at between 20× and 50 000× magnification. In addition to its great magnification, the SEM also has a great depth of field. Most SEMs also have a facility to analyse the X-rays given off by the target as a result of its bombardment and, as each element in the periodic table produces its own X-ray spectrum, this can be used to determine the elemental content of the sample.
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